Power-Electronic-Based Electric Machine Emulator Using Direct Impedance Regulation

国际期刊
Ke Ma ; Yubo Song
IEEE Transactions on Power Electronics, vol. 35, no. 10, pp. 10673-10680, Oct. 2020
Publication year: 2020

Modelling and Characterization of Frequency-domain Thermal Impedance for IGBT Module Through Heat Flow Information

国际期刊
Ke Ma ; Mengqi Xu ; Bo Liu
IEEE Trans. on Power Electronics, Vol. 36, No. 2, pp. 1330-1340, Feb. 2021.
Publication year: 2020

Mission-Profile-Based Testing Scheme for Sub-Modules in Modular Multilevel Converter

国际期刊
Yunxiao Yang, Weiyao Wang, Ke Ma
IEEJ Journal of Industry Applications, vol. 9, no. 3, pp. 219-226, May 2020.
Publication year: 2020

Efficient Capacitor Voltage Balancing Method for Modular Multilevel Converter under Carrier-Phase-Shift Pulse Width Modulation

国际期刊
Weiyao Wang ; Ke Ma ; Xu Cai
IEEE Trans. on Power Electronics, Vol. 36, No. 2, pp. 1626-1645, Feb. 2021.
Publication year: 2020

Critical Damping Ratio to Ensure Design Efficiency and Stability of LCL-Filters

国际期刊
Weiyu Tang ; Ke Ma ; Yubo Song
IEEE Transactions on Power Electronics, vol. 36, no. 1, pp. 315-325, Jan. 2021.
Publication year: 2020

一种DSP+FPGA/CPLD控制系统互联及同步策略

国内期刊
程然;马柯
电力电子技术,2019,53(06):35-38.
Publication year: 2019

Thermal Characterization Method of Power Semiconductors based on H-bridge Testing Circuit

国际期刊
Ye Zhu ; Ke Ma ; Xu Cai
IEEE Transactions on Power Electronics, vol. 34, no. 9, pp. 8268–8273, Sep. 2019.
Publication year: 2019

Asymmetrical Reactive Power Capability of Modular Multilevel Cascade Converter (MMCC) based STATCOMs for Offshore Wind Farm

国际期刊
Takaaki Tanaka ; Ke Ma ; Huai Wang ; Frede Blaabjerg
IEEE Transactions on Power Electronics, vol. 34, no. 6, pp. 5147-5164, June 2019.
Publication year: 2019

Validation of Lifetime Prediction of IGBT Modules Based on Linear Damage Accumulation by Means of Superimposed Power Cycling Tests

国际期刊
U. Choi, K. Ma, F. Blaabjerg
IEEE Transactions on Industrial Electronics, Vol. 65, No. 4, pp.3520-3529, 2018.
Publication year: 2018

Prediction and Validation of Wear-Out Reliability Metrics for Power Semiconductor Devices With Mission Profiles in Motor Drive Application

国际期刊
K. Ma, U. Choi, F. Blaabjerg
IEEE Transactions on Power Electronics, Vol. 33, No. 11, pp. 9843-9853, Nov. 2018.
Publication year: 2018